• DocumentCode
    1573592
  • Title

    High performance digital circuit design using Ballistic Nano-electronics

  • Author

    Purohit, Sohan ; Iniguez-de-la-Torre, Ignacio ; Kaushal, Vikas ; Margala, Martin

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, Lowell, MA, USA
  • fYear
    2010
  • Firstpage
    264
  • Lastpage
    267
  • Abstract
    With modern CMOS technology already close to approaching the limits of lithography, serious doubts exist over the ability of the standard CMOS ASIC design approach to deliver the required complexity, integration density and computational capability. This has prompted increasing research in novel non-CMOS devices to address the issues of modern day computing. This paper presents an investigation into the feasibility of recently proposed Ballistic Deflection Transistors (BDT) for future generation Terahertz computing. By means of Monte Carlo modeling we show that the device is capable of entering into the THz range at room temperature. We propose an analytical expression which can be used to describe an accurate behavioral model of BDT in Verilog-A, to serve as the first generation Predictive Technology Model for the Ballistic Deflection Transistor. We conclude presenting structures for various logic gates developed using the BDT.
  • Keywords
    Monte Carlo methods; application specific integrated circuits; digital integrated circuits; high-speed integrated circuits; integrated circuit modelling; nanoelectronics; CMOS ASIC design; Monte Carlo modeling; Verilog-A; application specific integrated circuits; ballistic deflection transistors; ballistic nanoelectronics; behavioral model; computational capability; digital circuit design; integration density; logic gates; predictive technology model; temperature 293 K to 298 K; terahertz computing; Application specific integrated circuits; CMOS technology; Digital circuits; Hardware design languages; Lithography; Logic gates; Monte Carlo methods; Predictive models; Submillimeter wave technology; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
  • Conference_Location
    Seattle, WA
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4244-7771-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2010.5548784
  • Filename
    5548784