• DocumentCode
    1573644
  • Title

    GaSb nanowire pFETs for III-V CMOS

  • Author

    Dey, Anil W. ; Svensson, Jorgen ; Borg, B. Mattias ; Ek, Martin ; Lind, Erik ; Wernersson, Lars-Erik

  • Author_Institution
    Dept. of Electr. & Inf. Technol., Lund Univ., Lund, Sweden
  • fYear
    2013
  • Firstpage
    13
  • Lastpage
    14
  • Abstract
    In order to reduce the power consumption, III-V semiconductor materials may be considered to lower the supply voltage. Reports on III-V complementary metal-oxide semiconductor (CMOS) circuitry are scarce and only few devices have been demonstrated to date. We have previously demonstrated III-V CMOS inverters by integrating n-InAs and p-GaSb segments in a single nanowire. Since the design was intended for functionality demonstration, using long gate lengths and a not intentionally doped channel, the operating frequency of the inverters was found to be limited by a large output parasitic capacitance on the pad and the low drive-currents of the GaSb pFET, as compared to the InAs nFET. We have previously shown that the performance of InAs nanowire nFETs can show large values of gm and ION through scaling and device design optimization. We here demonstrate steps to increase the performance of GaSb nanowire pFETs in a similar fashion.
  • Keywords
    CMOS integrated circuits; III-VI semiconductors; field effect transistor circuits; gallium compounds; indium compounds; integrated circuit design; invertors; nanowires; power consumption; CMOS; FET; GaSb; III-V semiconductor materials; InAs; complementary metal-oxide semiconductor; inverters; nanowire; output parasitic capacitance; power consumption; CMOS integrated circuits; III-V semiconductor materials; Inverters; Logic gates; Nanoscale devices; Performance evaluation; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2013 71st Annual
  • Conference_Location
    Notre Dame, IN
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4799-0811-0
  • Type

    conf

  • DOI
    10.1109/DRC.2013.6633771
  • Filename
    6633771