Title :
Application of microwave cavity perturbation techniques in conducting polymers
Author :
Wang, Z.H. ; Javadi, H.H.S. ; Epstein, A.J.
Author_Institution :
Dept. of Phys., Ohio State Univ., Columbus, OH, USA
Abstract :
Microwave cavity perturbation (MCP) techniques have been widely used to measure the conductivity (σ) and dielectric constant (ε) of many semiconductors and low-dimensional conductors. The authors briefly summarize the principles of MCP techniques and give a few suggestions for data analyses. Then they examine the applications of MCP to the conducting polyaniline hydrochloride and poly(otoluidine) hydrochloride materials
Keywords :
conducting polymers; electrical conductivity measurement; microwave measurement; permittivity measurement; conducting polymers; dielectric constant; electrical conductivity measurement; low-dimensional conductors; microwave cavity perturbation; organic compounds; permittivity; poly(otoluidine) hydrochloride; polyaniline hydrochloride; semiconductors; Conducting materials; Conductivity measurement; Data analysis; Dielectric constant; Dielectric materials; Dielectric measurements; Microwave measurements; Microwave theory and techniques; Perturbation methods; Semiconductor materials;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
0-87942-579-2
DOI :
10.1109/IMTC.1991.161544
