• DocumentCode
    1574408
  • Title

    S-Transform technique for identifying the location of a switched capacitor

  • Author

    Bhende, C.N.

  • Author_Institution
    Sch. of Electr. Sci., Indian Inst. of Technol. Bhubaneswar, Bhubaneswar, India
  • fYear
    2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents an integration of S-Transform and Probabilistic Neural Network (PNN) technique for identifying the location of a switched capacitor causing a power quality problem. The transient caused by the capacitor switching is one of the important power quality (PQ) problems since it may adversely affect the system as well as sensitive loads. S-Transform has the ability to detect the disturbance correctly in the presence of noise riding on the signal. Hence, S-Transform technique is used for locating switched capacitors under noisy environment. In order to extract efficient features, capacitor switching signals are applied to two S-Transform algorithms and they are processed parallely. Those features are then applied to PNN for training and subsequently tested for automatic classification of switching signals. The simulation results reveal that the combination of S-Transform and PNN can effectively locate the switched capacitor even under the noisy environment.
  • Keywords
    capacitor switching; distribution networks; feature extraction; neural nets; power engineering computing; power supply quality; transforms; PNN technique; PQ problems; S-transform technique; capacitor switching signals; distribution network; feature extraction; power quality problem; probabilistic neural network technique; switched capacitor location identification; Artificial neural networks; Capacitors; Feature extraction; Noise; Power quality; Switches; Transient analysis; Identification of switched capacitor; Probabilistic Neural Network; S-Transform; noisy environment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environment and Electrical Engineering (EEEIC), 2011 10th International Conference on
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4244-8779-0
  • Type

    conf

  • DOI
    10.1109/EEEIC.2011.5874846
  • Filename
    5874846