DocumentCode :
1574543
Title :
Optimal location for series FACTS devices to transient stability constrained congestion management
Author :
Moslemi, Ramin ; Shayanfar, Heydar Ali
Author_Institution :
Centre of Excellence for Power Syst. Autom. & Oper., Iran Univ. of Sci. & Technol., Tehran, Tehran, Iran
fYear :
2011
Firstpage :
1
Lastpage :
4
Abstract :
Nowadays, congestion management is one of major tasks in power system field. Congestion in transmission line imposes additional cost to power system costumers. One efficient solution to relieve congestion is locating facts devices, especially series Facts device like TCSC. Although many efficient approaches have been represented for locating FACTS devices, most of them neglect stability issues during optimization. In this paper the impact of locating series FACTS devices on transient stability margin is considered during conduct of optimization. To realize this goal corrected transient energy margin (CTEM) which is well-known transient stability index is applied as additional security transient constrain to control transient stability after locating FACTS devices. Proposed approach is tested for locating TCSC in New England 39-bus test system to prove efficiency of suggested method.
Keywords :
flexible AC transmission systems; power system management; power system security; power system transient stability; power transmission control; power transmission lines; CTEM; TCSC; congestion management; corrected transient energy margin; power system costumers; security transient constrain; series FACTS devices; transient stability control; transient stability index; transmission line; Power capacitors; Power system stability; Stability analysis; Thyristors; Transient analysis; FACTS devices; corrected transient energy margin; local marginal price; optimal location; security constrain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Environment and Electrical Engineering (EEEIC), 2011 10th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-8779-0
Type :
conf
DOI :
10.1109/EEEIC.2011.5874853
Filename :
5874853
Link To Document :
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