Palmprint Classification using Dual-Tree Complex Wavelets

A new palmprint classification method is proposed in this paper by using the dual-tree complex wavelet transform. The dual-tree complex wavelet transform has such important properties as the approximate shift-invariance and high directional selectivity. These properties are very important in invariant palmprint classification. Support vector machines are used as a classifier and the Gaussian radial basis function kernel is selected in the experiments. Experimental results show that the dual-tree complex wavelet features outperform the scalar wavelet features, and three previously developed methods. We conclude that the dual-tree complex wavelet features should be used for invariant palmprint classification instead of the scalar wavelet features.