DocumentCode :
1574800
Title :
Bending effect on frequency performance of InAlAs/InGaAs HEMT transferred on flexible substrate
Author :
Bollaert, S. ; Shi, Jack ; Wichmann, Nicolas ; Roelens, Yannick
Author_Institution :
IEMN, Univ. of Lille, Villeneuve-d´Ascq, France
fYear :
2013
Firstpage :
111
Lastpage :
112
Abstract :
100 nm gate length InAlAs/InGaAs high electron mobility transistors (HEMTs) have been transferred onto polyimide flexible substrate. In our previous paper, high frequency capability was demonstrated despite the presence of kink effect. Cutoff frequencies fT and fmax were respectively 120GHz and 280GHz and similar to value obtained on rigid substrate. In this work, we have designed a specific buffer layer in order to reduce the kink effect. Moreover the effect of bendabilty on RFperformance is explored on flexible devices.
Keywords :
III-V semiconductors; aluminium compounds; buffer layers; flexible electronics; gallium arsenide; high electron mobility transistors; indium compounds; millimetre wave transistors; InAlAs-InGaAs; InAlAs-InGaAs HEMT; bending effect; buffer layer; flexible devices; frequency 120 GHz; frequency 280 GHz; frequency performance; high electron mobility transistors; kink effect; polyimide flexible substrate; rigid substrate; size 100 nm; Current measurement; Cutoff frequency; Frequency measurement; HEMTs; Indium gallium arsenide; Strain; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2013 71st Annual
Conference_Location :
Notre Dame, IN
ISSN :
1548-3770
Print_ISBN :
978-1-4799-0811-0
Type :
conf
DOI :
10.1109/DRC.2013.6633818
Filename :
6633818
Link To Document :
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