• DocumentCode
    1574909
  • Title

    Design space exploration of FinFETs in sub-10nm technologies for energy-efficient near-threshold circuits

  • Author

    Gupta, Suneet K. ; Woo-Suhl Cho ; Goud, Akkala Arun ; Yogendra, K. ; Roy, Kaushik

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2013
  • Firstpage
    117
  • Lastpage
    118
  • Abstract
    Near-threshold (near-VTH) operation of circuits by scaling the supply voltage (VDD) leads to maximum energy efficiency of the digital systems [1]. However, since the device characteristics are different in super-threshold (super-VTH) and near-VTH regions, devices optimized for standard VDD operation may be sub-optimal for low VDD operation [2]. Hence, there is a need to perform circuit-aware device design for near-VTH transistors. In this paper, we explore the design space of transistors in deeply scaled technologies (nominal gate length of 5nm) for nearVTH operation. We choose FinFETs for our study due to their excellent short channel characteristics. A detailed analysis of device circuit interactions is carried out using our simulation framework based on tight-binding bandstructure calculations, quantum ballistic models for devices and circuit simulations in HSPICE. We show the dependence of energy dissipation in near-VTH circuits on different device parameters. Based on our analysis, we discuss the design methodology for near-VTH devices.
  • Keywords
    MOSFET; optimisation; semiconductor device models; FinFET; HSPICE; VDD; circuit-aware device design; deeply scaled technologies; device circuit interactions; digital systems; energy-efficient near-threshold circuits; near-VTH operation; near-VTH transistors; quantum ballistic models; simulation framework; super-VTH regions; super-threshold regions; supply voltage; tight-binding bandstructure calculations; Capacitance; FinFETs; Integrated circuit modeling; Leakage currents; Logic gates; Optimization; Space exploration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2013 71st Annual
  • Conference_Location
    Notre Dame, IN
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4799-0811-0
  • Type

    conf

  • DOI
    10.1109/DRC.2013.6633821
  • Filename
    6633821