DocumentCode
1574909
Title
Design space exploration of FinFETs in sub-10nm technologies for energy-efficient near-threshold circuits
Author
Gupta, Suneet K. ; Woo-Suhl Cho ; Goud, Akkala Arun ; Yogendra, K. ; Roy, Kaushik
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear
2013
Firstpage
117
Lastpage
118
Abstract
Near-threshold (near-VTH) operation of circuits by scaling the supply voltage (VDD) leads to maximum energy efficiency of the digital systems [1]. However, since the device characteristics are different in super-threshold (super-VTH) and near-VTH regions, devices optimized for standard VDD operation may be sub-optimal for low VDD operation [2]. Hence, there is a need to perform circuit-aware device design for near-VTH transistors. In this paper, we explore the design space of transistors in deeply scaled technologies (nominal gate length of 5nm) for nearVTH operation. We choose FinFETs for our study due to their excellent short channel characteristics. A detailed analysis of device circuit interactions is carried out using our simulation framework based on tight-binding bandstructure calculations, quantum ballistic models for devices and circuit simulations in HSPICE. We show the dependence of energy dissipation in near-VTH circuits on different device parameters. Based on our analysis, we discuss the design methodology for near-VTH devices.
Keywords
MOSFET; optimisation; semiconductor device models; FinFET; HSPICE; VDD; circuit-aware device design; deeply scaled technologies; device circuit interactions; digital systems; energy-efficient near-threshold circuits; near-VTH operation; near-VTH transistors; quantum ballistic models; simulation framework; super-VTH regions; super-threshold regions; supply voltage; tight-binding bandstructure calculations; Capacitance; FinFETs; Integrated circuit modeling; Leakage currents; Logic gates; Optimization; Space exploration;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2013 71st Annual
Conference_Location
Notre Dame, IN
ISSN
1548-3770
Print_ISBN
978-1-4799-0811-0
Type
conf
DOI
10.1109/DRC.2013.6633821
Filename
6633821
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