Title :
Efficient encoding and decoding algorithm used in Reed-Solomon codes for multiple fault-tolerance memories
Author :
Xiao, Liyi ; Sun, Zheng ; Zhu, Ming
Author_Institution :
Microelectron. Center, Harbin Inst. of Technol., Harbin, China
Abstract :
With the increasing density of transistor and the probability of MBUs (Multiple Bits Upsets), Hamming code is not enough to provide required reliability in memories. Therefore multiple error correction codes are necessity. In this paper, Reed-Solomon (RS) codes are proposed to protect memories against MBUs which can achieve higher error correction capability (e.g. 8 bits). Besides a novel and low overhead multiplication algorithm is proposed and used in RS codes encoding and decoding process. At last, the encoder and decoder are implemented using Verilog HDL and validated through a number of simulations. The experiment results show that compared with other ECCs, RS code has higher error correction capability and lower area overhead.
Keywords :
Hamming codes; Reed-Solomon codes; decoding; encoding; error correction codes; hardware description languages; integrated memory circuits; Hamming code; Reed-Solomon codes; Verilog HDL; decoding algorithm; encoding algorithm; error correction code; fault-tolerance memory; multiple bits upsets; transistor; Decoding; Memory management; Reed-Solomon codes; memories; multiple bits upsets; multiplication;
Conference_Titel :
Cross Strait Quad-Regional Radio Science and Wireless Technology Conference (CSQRWC), 2011
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-9792-8
DOI :
10.1109/CSQRWC.2011.6037272