DocumentCode :
1575105
Title :
Turtle Logic: A new probabilistic design methodology of nanoscale digital circuits
Author :
Garcia-Leyva, Lancelot ; Calomarde, Antonio ; Moll, Francesc ; Rubio, Antonio
Author_Institution :
Fac. de Cienc. Basicas, Ing. y Tecnol., Univ. Autonoma de Tlaxcala, Tlaxcala, Mexico
fYear :
2010
Firstpage :
1101
Lastpage :
1104
Abstract :
As devices and operating voltages are scaled down, future circuits will be plagued by higher soft error rates, reduced noise margins and defective devices. A key challenge for the future technologies is to retain circuit reliability in the presence of faults and noise. The Turtle Logic (TL) is a new probabilistic logic method based on port redundancy and complementary data, oriented to emerging and beyond CMOS technologies. The TL is a technology independent method, which aims to improve tolerance to errors due to noise in single gates, logic blocks or functional units. The TL operation is based on the consistency relation of redundant inputs. In case of discrepancy, the output of the system keeps the previous value, therefore avoiding the propagation of incorrect inputs. Simulations show an excellent performance of TL in the presence of large random noise at the inputs, as well as intrinsic noise (thermal noise and flicker noise) and shot noise in the power source.
Keywords :
CMOS digital integrated circuits; integrated circuit reliability; logic circuits; CMOS technologies; circuit reliability; complementary data; flicker noise; functional units; intrinsic noise; logic blocks; nanoscale digital circuits; port redundancy; probabilistic design methodology; probabilistic logic method; single gates; soft error rates; thermal noise; turtle logic; 1f noise; CMOS logic circuits; CMOS technology; Circuit noise; Design methodology; Digital circuits; Logic circuits; Logic design; Logic devices; Probabilistic logic;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
Conference_Location :
Seattle, WA
ISSN :
1548-3746
Print_ISBN :
978-1-4244-7771-5
Type :
conf
DOI :
10.1109/MWSCAS.2010.5548845
Filename :
5548845
Link To Document :
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