• DocumentCode
    1575105
  • Title

    Turtle Logic: A new probabilistic design methodology of nanoscale digital circuits

  • Author

    Garcia-Leyva, Lancelot ; Calomarde, Antonio ; Moll, Francesc ; Rubio, Antonio

  • Author_Institution
    Fac. de Cienc. Basicas, Ing. y Tecnol., Univ. Autonoma de Tlaxcala, Tlaxcala, Mexico
  • fYear
    2010
  • Firstpage
    1101
  • Lastpage
    1104
  • Abstract
    As devices and operating voltages are scaled down, future circuits will be plagued by higher soft error rates, reduced noise margins and defective devices. A key challenge for the future technologies is to retain circuit reliability in the presence of faults and noise. The Turtle Logic (TL) is a new probabilistic logic method based on port redundancy and complementary data, oriented to emerging and beyond CMOS technologies. The TL is a technology independent method, which aims to improve tolerance to errors due to noise in single gates, logic blocks or functional units. The TL operation is based on the consistency relation of redundant inputs. In case of discrepancy, the output of the system keeps the previous value, therefore avoiding the propagation of incorrect inputs. Simulations show an excellent performance of TL in the presence of large random noise at the inputs, as well as intrinsic noise (thermal noise and flicker noise) and shot noise in the power source.
  • Keywords
    CMOS digital integrated circuits; integrated circuit reliability; logic circuits; CMOS technologies; circuit reliability; complementary data; flicker noise; functional units; intrinsic noise; logic blocks; nanoscale digital circuits; port redundancy; probabilistic design methodology; probabilistic logic method; single gates; soft error rates; thermal noise; turtle logic; 1f noise; CMOS logic circuits; CMOS technology; Circuit noise; Design methodology; Digital circuits; Logic circuits; Logic design; Logic devices; Probabilistic logic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
  • Conference_Location
    Seattle, WA
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4244-7771-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2010.5548845
  • Filename
    5548845