• DocumentCode
    1575152
  • Title

    Realization of efficient and low-power parallel face-detection with massive-parallel memory-embedded SIMD matrix

  • Author

    Kumaki, Takeshi ; Imai, Yuta ; Hiramoto, Hirokazu ; Koide, Tetsushi ; Mattausch, Hans Jurgen

  • Author_Institution
    Res. Inst. for Nanodevices & Bio Syst. (RNBS), Hiroshima Univ., Higashi-Hiroshima, Japan
  • fYear
    2010
  • Firstpage
    359
  • Lastpage
    362
  • Abstract
    This paper presents an efficient and low-power-consumption parallel face-detection technology based on Haar-like features and implemented with a massive-parallel memory-embedded SIMD matrix. The massive-parallel memory-embedded SIMD matrix architecture has up to 2,048 2-bit processing elements, which are connected by a flexible switching network, and supports 2-bit 2,048-way bit-serial and word-parallel operations with a single command. For experimented verification of this matrix processing architecture, this parallel Haar-like-feature based face-detection technique has been implemented on an evaluation board and tested in practice. Evaluation results show that a total processing time of about 313 ms at 162 MHz clock frequency and 150 mW power dissipation can be realized. Thus, the reported parallel-face detection method with the massive-parallel memory-embedded SIMD matrix is a practical technology and is a promising solution for real-time mobile multimedia applications.
  • Keywords
    Haar transforms; embedded systems; face recognition; matrix algebra; parallel memories; parallel processing; bit processing elements; clock frequency; low power parallel face detection; massive parallel memory embedded SIMD matrix; matrix processing architecture; mobile multimedia applications; parallel Haar-like-feature; power dissipation; Arithmetic; CMOS technology; Clocks; Energy consumption; Face detection; Frequency; Hardware; Memory architecture; Power dissipation; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
  • Conference_Location
    Seattle, WA
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4244-7771-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2010.5548847
  • Filename
    5548847