DocumentCode
1575361
Title
Graphene p-n junctions for electron-optics devices
Author
Sutar, Surajit ; Comfort, Everett ; Ji Ung Lee
Author_Institution
Coll. of Nanoscale Sci. & Eng., UAlbany-SUNY, Albany, NY, USA
fYear
2013
Firstpage
149
Lastpage
150
Abstract
The p-n junction is the building block for nearly all modern semiconductor devices, including transistors, Lasers, and LEDs. The absence of band gap in graphene, however, prevents the construction of same types of devices with graphene p-n junctions. Instead, graphene junctions are predicted to form a new class of electronic devices that have no analogue in modern electronics. Instead of turning on and off the flow of carriers, as in modern electronic devices, graphene junctions are predicted to manipulate carriers in the same way photons are guided in optics. These devices rely on the unique angle-dependent transport properties of graphene junctions. Unlike in bulk junctions, the transport in graphene junctions has a strong dependence on the transverse momentum of incident carriers. This gives rise to an angle dependence which can enable `electron optics´ devices. A number of such devices have been proposed that manipulate carriers in much the same way photons are guided in optics. They include the Veselago device, wave guiding structures, and steep subthreshold slope devices. These devices require the construction of graphene p-n junctions, because the junction can function as a dielectric discontinuity for carriers and can create either a negative or positive index of refraction. To that end, experimental verification of this angle-dependent transmission in graphene p-n junctions is provided herein.
Keywords
electro-optical devices; graphene; p-n junctions; refraction; Veselago device; angle-dependent transport property; dielectric discontinuity; electron-optics device; graphene p-n junction; modern electronic device; negative refraction index; positive refraction index; semiconductor device; steep subthreshold slope device; wave guiding structure; Dielectrics; Doping; Graphene; Logic gates; P-n junctions; Resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2013 71st Annual
Conference_Location
Notre Dame, IN
ISSN
1548-3770
Print_ISBN
978-1-4799-0811-0
Type
conf
DOI
10.1109/DRC.2013.6633837
Filename
6633837
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