Title :
Electrical derivative measurement of quantum cascade lasers (QCLs)
Author :
Guo, Dingkai ; Chen, Xing ; Cheng, Liwei ; Graninger, Aurelius ; Choa, Fow-Sen
Author_Institution :
Dept. of Comput. Sci. & Electr. Eng., Univ. of Maryland, Baltimore, MD
Abstract :
Testing QCL devices usually requires cryogenic systems, mid-IR windows, optics and detectors. We report here the demonstration of an electrical derivative method that can quickly measure QCL lasing thresholds without using mid-IR optics or detectors.
Keywords :
III-V semiconductors; aluminium compounds; electrical resistivity; gallium arsenide; indium compounds; laser variables measurement; quantum cascade lasers; InGaAs-InAlAs; electrical derivative measurement; lasing threshold measurement; quantum cascade lasers; Electric variables measurement; Electrical resistance measurement; Laser modes; Optical pulses; Optical sensors; Pulse measurements; Quantum cascade lasers; Semiconductor device measurement; Temperature; Testing;
Conference_Titel :
IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008. 21st Annual Meeting of the
Conference_Location :
Acapulco
Print_ISBN :
978-1-4244-1931-9
Electronic_ISBN :
978-1-4244-1932-6
DOI :
10.1109/LEOS.2008.4688866
