Title :
Research on allocation of gross electromagnetic pollution emission right in power quality markets
Author :
Jin, Guanghou ; Li, Gengyin ; Zhou, Ming ; Ni, Yixin
Author_Institution :
Sch. of Electr. Eng., North China Electr. Power Univ., Baoding, China
Abstract :
Management of power quality (PQ) suffers more pressure from economy and social equity, it is necessary to control electromagnetic pollution emitted from both electric utilities and customers. Calculation of optimal emission right (ER) gross and its distribution is an important content of controlling electromagnetic pollution, and it should be worked out based on cooperative game. This paper analyses game actions among all members in one point of common connection (PCC) for pursuing ER and high PQ, and clarifies the highest price of ER and PQ service that is acceptable for gamers. This paper adopts uniform price sealed auction model to make gamers take the acceptable highest price of ER and PQ service as their bidding price, and PQ supervision department (PQSD) can make full use of their information from auction, then the calculated ER gross can satisfy Pareto optimality. That gross can maximize social integrative benefits. This auction model also proposes the Bayes Nash equilibrium for the optimal distribution of ER among all gamers. This equilibrium can optimize distribution of social and electromagnetic resource. Examples indicate that the proposed model for optimal gross and distribution of ER based on game theory is feasible and effective.
Keywords :
Bayes methods; game theory; pollution control; power markets; power supply quality; Bayes Nash equilibrium; Pareto optimality; bidding price; electromagnetic pollution emission control; game theory; gross electromagnetic pollution emission; point of common connection; power quality management; power quality markets; Energy management; Erbium; Game theory; Nash equilibrium; Optimal control; Pollution; Power industry; Power quality; Pressure control; Quality management;
Conference_Titel :
Power Engineering Society General Meeting, 2005. IEEE
Print_ISBN :
0-7803-9157-8
DOI :
10.1109/PES.2005.1489325