DocumentCode
1575523
Title
Rate-dependent coercivity and activation volumes in nanocrystalline FeZrBCu alloys
Author
Basso, V. ; Beatrice, Cinzia ; LoBue, Martino ; Tiberto, Paola ; Bertotti, Gabriel ; Grossinger, Roland ; Tritono, D.
Author_Institution
IEN Galileo Ferraris, INFM, Torino, Italy
fYear
2002
Abstract
Summary form only given. In nanocrystalline grain/amorphous matrix systems well above the Curie temperature of the amorphous part, the system does not behave like a system of superparamagnetic particles, as it should be at those temperatures, but still exhibits hysteresis. This effect could be explained by invoking the existence of some correlation length larger then the grain size. Since thermal activation is connected to a typical activation volume, this correlation length may also be estimated by studying the rate dependence of hysteresis properties. We have applied this method to the study of Fe/sub 86/Zr/sub 7/B/sub 6/Cu/sub 1/ ribbons. Hysteresis loops have been measured as a function of temperature and crystalline fraction. The coercivity was studied as a function of the field rate in the range 10/sup 2/-10/sup 7/ Am/sup -1/ s/sup -1/.
Keywords
boron alloys; coercive force; copper compounds; ferromagnetic materials; grain size; iron alloys; magnetic hysteresis; nanostructured materials; zirconium alloys; Fe/sub 86/Zr/sub 7/B/sub 6/Cu/sub 1/; Fe/sub 86/Zr/sub 7/B/sub 6/Cu/sub 1/ ribbons; activation volume; coercivity; correlation length; crystalline fraction dependence; grain size; hysteresis loops; magnetic field rate dependence; magnetic hysteresis; nanocrystalline alloys; nanocrystalline grain/amorphous matrix systems; superparamagnetic particles; temperature dependence; thermal activation; Amorphous materials; Coercive force; Couplings; Crystallization; Grain size; Magnetic hysteresis; Magnetic materials; Magnetization processes; Nanostructured materials; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location
Amsterdam, The Netherlands
Print_ISBN
0-7803-7365-0
Type
conf
DOI
10.1109/INTMAG.2002.1001413
Filename
1001413
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