Test and Repair Flow for Shared BISR in Asynchronous Multi-processors

Author

Gang Wang ; Xu Wang ; Xinke Chen ; Shuangbai Xue

Author_Institution

Key Lab. of Comput. Syst. & Archit., Beijing, China

fYear

2014

fDate

12-14 May 2014

Firstpage

105

Lastpage

107

Abstract

We present a hierarchical test and repair flow for shared BISR (Built-In Self-Repair) in asynchronous multi-processors. The flow partitions the memories local to a processor in groups and treats the groups as a whole when doing the repair. The flow runs automatically with few interventions except at the beginning stage. It can be used effectively for practical industrial test and repair. Its test time is as good as equivalent to that of parallel BISR, while its test power is substantially lower, about 40% that of parallel repair. It also has a superior repair rate, about 11-12% better compared to sequential and parallel BISR.

Keywords

asynchronous circuits; built-in self test; integrated circuit reliability; multiprocessing systems; asynchronous multiprocessors; built-in self-repair; flow partitions; hierarchical test flow; parallel BISR; repair flow; shared BISR; Built-in self-test; Computers; Maintenance engineering; Program processors; Synchronization; System-on-chip; Asynchronous Multi-Processors; Repair; Shared BISR; Test;

fLanguage

English

Publisher

ieee

Conference_Titel

Asynchronous Circuits and Systems (ASYNC), 2014 20th IEEE International Symposium on

Conference_Location

Potsdam

ISSN

1522-8681

Type

conf

DOI

10.1109/ASYNC.2014.23

Filename

6835819