Title :
Test and Repair Flow for Shared BISR in Asynchronous Multi-processors
Author :
Gang Wang ; Xu Wang ; Xinke Chen ; Shuangbai Xue
Author_Institution :
Key Lab. of Comput. Syst. & Archit., Beijing, China
Abstract :
We present a hierarchical test and repair flow for shared BISR (Built-In Self-Repair) in asynchronous multi-processors. The flow partitions the memories local to a processor in groups and treats the groups as a whole when doing the repair. The flow runs automatically with few interventions except at the beginning stage. It can be used effectively for practical industrial test and repair. Its test time is as good as equivalent to that of parallel BISR, while its test power is substantially lower, about 40% that of parallel repair. It also has a superior repair rate, about 11-12% better compared to sequential and parallel BISR.
Keywords :
asynchronous circuits; built-in self test; integrated circuit reliability; multiprocessing systems; asynchronous multiprocessors; built-in self-repair; flow partitions; hierarchical test flow; parallel BISR; repair flow; shared BISR; Built-in self-test; Computers; Maintenance engineering; Program processors; Synchronization; System-on-chip; Asynchronous Multi-Processors; Repair; Shared BISR; Test;
Conference_Titel :
Asynchronous Circuits and Systems (ASYNC), 2014 20th IEEE International Symposium on
Conference_Location :
Potsdam
DOI :
10.1109/ASYNC.2014.23
