DocumentCode :
157558
Title :
Clockless Design Performance Monitoring for Nanometer Technologies
Author :
Renaudin, Marc ; Buhrig, Aurelien ; Guillemet, Charles ; Wilson, Richard ; Engels, S.
Author_Institution :
TIEMPO-SAS, Montbonnot Saint Martin, France
fYear :
2014
fDate :
12-14 May 2014
Firstpage :
108
Lastpage :
109
Abstract :
This paper introduces a breakthrough in the domain of performance process monitoring that is based on clockless asynchronous circuits. The process monitoring chip was fabricated using 32 nm and 28 nm bulk technologies and enabled relevant process parameters monitoring using an easy-to-use set-up.
Keywords :
asynchronous circuits; logic design; process monitoring; bulk technologies; clockless asynchronous circuits; easy-to-use set-up; nanometer technologies; performance process monitoring; process monitoring chip; relevant process parameters monitoring; size 28 nm; size 32 nm; Asynchronous circuits; Clocks; Libraries; Monitoring; Silicon; Solid modeling; Voltage measurement; asynchronous design; clockless design; nanometer technologies; process monitoring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asynchronous Circuits and Systems (ASYNC), 2014 20th IEEE International Symposium on
Conference_Location :
Potsdam
ISSN :
1522-8681
Type :
conf
DOI :
10.1109/ASYNC.2014.24
Filename :
6835820
Link To Document :
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