Title :
Soft x-ray microscopy
Author :
Attwood, David ; Fischer, Peter ; Anderson, Erik ; Larabell, Carolyn ; LeGros, Mark ; Monteiro, Paulo ; Chao, Weilun ; Sakdinawat, Anne ; Mesler, Brooke
Author_Institution :
Univ. of California, Berkeley, CA
Abstract :
Summary form only given. Soft X-ray microscopy is at the forefront of research with spatial resolution approaching 10 nm, and wide ranging applications to the physical and life sciences, including the dynamics of magnetic nanostructures, three-dimensional biotomography at the sub-cellular level, elemental and chemically specific environmental studies. Examples of recent work are shown below in figures 1-3. Figure 1 shows a general layout of the soft X-ray microscope XM-1 at the Advanced Light Source (ALS) synchrotron facility at Lawrence Berkeley National Laboratory. Figure 2 shows an image, at 15 nm spatial resolution, of nanomagnetic structures in a CoCrPt alloy as revealed by X-ray magnetic circular dichroism (XMCD) using synchrotron radiation tuned to the cobalt L3-edge at 778 eV (1.59 nm wavelength). Figure 3 shows a natural contrast tomographic reconstruction of a whole yeast cell imaged in the water window at 500 eV (2.4 nm wavelength).
Keywords :
X-ray microscopy; biological techniques; cellular biophysics; chromium alloys; cobalt alloys; computerised tomography; magnetic circular dichroism; nanostructured materials; platinum alloys; CoCrPt; X-ray magnetic circular dichroism; electron volt energy 500 eV; electron volt energy 778 eV; nanomagnetic structures; natural contrast tomographic reconstruction; soft X-Ray microscopy; spatial resolution; synchrotron radiation; three-dimensional biotomography; wavelength 1.59 nm; wavelength 2.4 nm; yeast cell; Chemical elements; Cobalt alloys; Laboratories; Light sources; Magnetic force microscopy; Nanostructures; Spatial resolution; Synchrotron radiation; Tomography; X-ray imaging;
Conference_Titel :
IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008. 21st Annual Meeting of the
Conference_Location :
Acapulco
Print_ISBN :
978-1-4244-1931-9
Electronic_ISBN :
978-1-4244-1932-6
DOI :
10.1109/LEOS.2008.4688876