DocumentCode :
1575646
Title :
Natural vibration frequencies of silicon diaphragms
Author :
Pons, P. ; Blasquez, G.
fYear :
1991
Firstpage :
543
Lastpage :
546
Abstract :
It is postulated that the behavior of square and rectangular silicon diaphragms used in pressure sensors is governed by a Lagrange-Newton differential system. Estimation of the natural vibration frequencies using Galerkin´s method shows that the anisotropic characteristic of silicon does not significantly influence the results. Excitation and detection of the first vibration modes are carried out in a straightforward manner with a capacitive sensor whose fixed plate features an array structure. Measurements of the first natural vibration frequencies and those predicted by the Newton-Lagrange model are in good agreement. The reduced Young´s modulus given by these experiments is fifteen percent higher than the one generally reported in the literature. It is concluded that capacitive devices are well suited for the study of silicon diaphragm vibrations.<>
Keywords :
Young´s modulus; differential equations; electric sensing devices; elemental semiconductors; frequency measurement; micromechanical devices; pressure transducers; silicon; vibration measurement; Galerkin´s method; Lagrange-Newton differential system; Young´s modulus; anisotropic characteristic; array structure; capacitive devices; capacitive sensor; first vibration modes; fixed plate; natural vibration frequencies; pressure sensors; rectangular diaphragm; square diaphragm; Anisotropic magnetoresistance; Capacitive sensors; Frequency estimation; Lagrangian functions; Moment methods; Sensor arrays; Sensor phenomena and characterization; Sensor systems; Silicon; Vibration measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors and Actuators, 1991. Digest of Technical Papers, TRANSDUCERS '91., 1991 International Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-585-7
Type :
conf
DOI :
10.1109/SENSOR.1991.148933
Filename :
148933
Link To Document :
بازگشت