DocumentCode :
1575652
Title :
Zinc oxide ring oscillators with vertical thin film transistors
Author :
Nelson, Shelby F. ; Tutt, Lee W.
Author_Institution :
Kodak Technol. Center, Eastman Kodak Co., Rochester, NY, USA
fYear :
2013
Firstpage :
169
Lastpage :
170
Abstract :
Metal oxide semiconductors have given new life to the field of thin film electronics by exhibiting high performance for relatively low process temperatures, especially compared to amorphous silicon. In some cases, the fact that standard processing techniques can be used with these materials is an advantage because they can “drop-in” to existing facilities1, and adoption in the large-area display backplane arena is underway.In this report we present oxide-based vertical thin film transistor (VTFT) circuits with alignment tolerances of tens of microns, and operation below 6 V.
Keywords :
II-VI semiconductors; oscillators; thin film transistors; wide band gap semiconductors; zinc compounds; ZnO; alignment tolerances; metal oxide semiconductors; oxide-based vertical thin film transistor circuits; zinc oxide ring oscillators; Electrodes; Logic gates; Ring oscillators; Substrates; Thin film transistors; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2013 71st Annual
Conference_Location :
Notre Dame, IN
ISSN :
1548-3770
Print_ISBN :
978-1-4799-0811-0
Type :
conf
DOI :
10.1109/DRC.2013.6633847
Filename :
6633847
Link To Document :
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