Title :
A novel double slope analog-to-digital converter for a high-quality 640×480 CMOS imaging system
Author :
Kwon, Oh-Bong ; Park, Ki-Nam ; Lee, Do-Young ; Lee, Kang-Jin ; Jun, Sung-Chun ; Kim, Chan-Ki ; Yang, W.
Author_Institution :
Image Sensor Dev. Syst. IC R&D, Hyundai Electron. Inc., South Korea
fDate :
6/21/1905 12:00:00 AM
Abstract :
In this paper, a novel double slope ADC (Analog-to-Digital Converter) for imaging applications is proposed. With this conversion technique, the resolution of images can be increased especially for low illumination environments while maintaining wide dynamic range. The proposed double slope ADC is implemented with a parallel bank of 640 pseudo-l0b ADCs in a 3.3 V single chip digital CMOS image sensor with 640×480 (VGA) pixel array, 3.04 kB DRAM line buffer, and digital control block using a 0.5 μm single poly, triple metal DRAM baseline
Keywords :
CMOS image sensors; analogue-digital conversion; image resolution; integrating circuits; programmable circuits; 0.5 mum; 3.3 V; 307200 pixel; 480 pixel; 640 pixel; DRAM line buffer; VGA pixel array; conversion technique; digital control block; double slope ADC; double slope analog-to-digital converter; high-quality CMOS imaging system; image resolution; low illumination environments; parallel bank; programmable slope integrator; single chip digital CMOS image sensor; single poly triple metal DRAM baseline; wide dynamic range; Analog-digital conversion; CMOS image sensors; Digital control; Dynamic range; High-resolution imaging; Image converters; Image resolution; Lighting; Pixel; Sensor arrays;
Conference_Titel :
VLSI and CAD, 1999. ICVC '99. 6th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-5727-2
DOI :
10.1109/ICVC.1999.820923
