DocumentCode :
1576477
Title :
Heat dissipation and thermometry in nanosystems: When interfaces dominate
Author :
Gotsmann, Bernd ; Menges, Fabian ; Karg, Siegfried ; Troncale, Valentina ; Lantz, Mark ; Mensch, Philipp ; Schmid, Heinz ; Das Kanungo, Pratyush ; Drechsler, U. ; Schmidt, Volker ; Tschudy, Meinrad ; Stemmer, Andreas ; Riel, Heike
Author_Institution :
IBM Res. - Zurich, Rueschlikon, Switzerland
fYear :
2013
Firstpage :
231
Lastpage :
232
Abstract :
The technological need for characterization of scaled nano-devices is not paralleled with the availability of methods to measure heat flux and temperature on small scales. To measure local temperature and conductance variation we therefore focus on developing measurement tools. These are based on (A) scanning a thermometer across the sample surface region of interest, so called scanning thermal microscopy (SThM), (B) measuring thermal properties directly through self-heating, and (C) measuring directly the heat-flux through 1D-structures.
Keywords :
cooling; nanoelectronics; temperature measurement; thermometers; 1D-structures; conductance variation measurement; heat dissipation; heat flux; local temperature measurement; measurement tools; nanosystems; scaled nano-devices; scanning thermal microscopy; self-heating; thermal properties; thermometer; thermometry; Electrodes; Heating; Nanoscale devices; Substrates; Temperature; Temperature measurement; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2013 71st Annual
Conference_Location :
Notre Dame, IN
ISSN :
1548-3770
Print_ISBN :
978-1-4799-0811-0
Type :
conf
DOI :
10.1109/DRC.2013.6633878
Filename :
6633878
Link To Document :
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