DocumentCode
1576674
Title
Can we engineer current saturation in narrow gap graphitic FETs without hurting mobility?
Author
Tseng, Fan-Shuo ; Fiori, G. ; Ghosh, Avik W.
Author_Institution
ECE, Univ. of Virginia, Charlottesville, VA, USA
fYear
2013
Firstpage
1
Lastpage
2
Abstract
While a wide bandgap material with poor mobility can saturate the output current, we demonstrate a way to achieve clear current saturation in the output characteristics using narrow-bandgap, high mobility graphitic-channels(Fig.4b, 4c) without hurting the mobility. Using gate engineering alone, we preserve the intrinsic narrow bandgap but locally cascade them along the channel. This filters intermediate conduction and valence bands and widens the gap in the tranmission (Fig.3) without sacrificing mobility. A widen transmission gap delays the onset of band-to-band tunneling, which normally plagues devices with a narrow bandgap channel. Results are verified using an optimized fully atomistic non-equilibrium Green´s Function(NEGF) solver with complex 3-D Poisson1. A graphitic channel is used as a template but is one of many possible narrow-bandgap materials with high mobility. Without hurting mobility, the improved current saturation is expected to enhance gain for radio frequency(RF) and potentially digital switching applications by significantly decreasing output conductance(gds)2.
Keywords
Green´s function methods; conduction bands; field effect transistors; graphite; narrow band gap semiconductors; tunnelling; valence bands; C; band-to-band tunneling; complex 3-D Poisson; conduction bands; current saturation; digital switching applications; gate engineering; high mobility graphitic-channels; intrinsic narrow bandgap; narrow gap graphitic FET; narrow-bandgap channels; optimized fully atomistic nonequilibrium Green´s function solver; output characteristics; output conductance; radio frequency gain; tranmission gap; valence bands; Graphene; Logic gates; Materials; Photonic band gap; Resistance; Switches; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2013 71st Annual
Conference_Location
Notre Dame, IN
ISSN
1548-3770
Print_ISBN
978-1-4799-0811-0
Type
conf
DOI
10.1109/DRC.2013.6633886
Filename
6633886
Link To Document