DocumentCode :
1576807
Title :
Depletion-mode Ga2O3 MOSFETs
Author :
Higashiwaki, Masataka ; Sasaki, Kazuhiko ; Kamimura, Taeko ; Wong, Man Hoi ; Krishnamurthy, Dheepak ; Kuramata, Akito ; Masui, Takekazu ; Yamakoshi, Shigenobu
Author_Institution :
Nat. Inst. of Inf. & Commun. Technol. (NICT), Koganei, Japan
fYear :
2013
Firstpage :
1
Lastpage :
2
Abstract :
We have been proposing a new oxide compound semiconductor, gallium oxide (Ga2O3), as a promising candidate for power device applications because of its excellent material properties and suitability for mass production. The 4.8-eV bandgap and the Baliga´s figure of merit of Ga2O3 are much larger than those of SiC and GaN, which will enable Ga2O3 power devices with higher breakdown voltage and efficiency than SiC and GaN devices. The other important advantage of Ga2O3 is that a single-crystal bulk can be grown by using the same melt growth method as is used for sapphire. Therefore, Ga2O3 power devices have the obvious potential to surpass SiC and GaN in not only device performance but also cost effectiveness. In this work, we fabricated and demonstrated depletion-mode Ga2O3 metal-oxide-semiconductor field-effect transistors (MOSFETs).
Keywords :
gallium compounds; power MOSFET; semiconductor device breakdown; wide band gap semiconductors; Baliga figure of merit; Ga2O3; bandgap; breakdown voltage; depletion-mode Ga2O3 MOSFET; melt growth method; metal-oxide-semiconductor field-effect transistors; oxide compound semiconductor; power devices; single-crystal bulk; Annealing; Gallium nitride; Logic gates; MOSFET; Silicon; Substrates; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2013 71st Annual
Conference_Location :
Notre Dame, IN
ISSN :
1548-3770
Print_ISBN :
978-1-4799-0811-0
Type :
conf
DOI :
10.1109/DRC.2013.6633890
Filename :
6633890
Link To Document :
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