DocumentCode :
1576970
Title :
Improvement of SVM Algorithm for Microarray Analysis Using Intelligent Parameter Selection
Author :
Phan, John ; Moffitt, Richard ; Dale, Jennifer ; Petros, John ; Young, Andrew ; Wang, May
Author_Institution :
Wallace H. Coulter Dept. of Biomed. Eng., Georgia Inst. of Technol., Atlanta, GA
fYear :
2005
fDate :
6/27/1905 12:00:00 AM
Firstpage :
4838
Lastpage :
4841
Abstract :
Identification of genetic markers is a crucial step in the diagnosis, prognosis, and treatment of disease. This paper focuses on the application of a supervised classification technique, support vector machines (SVM), to high dimensional microarrays for marker identification. A case study of renal cell carcinoma (RCC) is used here to demonstrate and test the ability of SVMs to identify real biological markers. SVMs are known to be suitable for high dimensional microarray data and are able to classify non-linear relationships in the data through the use of kernel functions specific to the datasets. This paper compares multiple SVM kernel functions, both linear and nonlinear, to determine which form is best suited for a particular dataset. Additionally, each SVM is tested across a range of parameters and normalization schemes to further identify a specific optimal classifier. Empirical results are then used to determine the optimum parameters for the SVM to efficiently find biologically important predictive markers for differentiation between RCC subtypes for the purpose of diagnosis and prognosis
Keywords :
arrays; cancer; cellular biophysics; genetics; kidney; medical diagnostic computing; molecular biophysics; patient diagnosis; support vector machines; SVM algorithm; disease diagnosis; disease prognosis; genetic markers; high dimensional microarrays; intelligent parameter selection; kernel functions; marker identification; microarray analysis; normalization; optimal classifier; renal cell carcinoma; supervised classification; Algorithm design and analysis; Biomarkers; Cells (biology); Diseases; Genetics; Kernel; Machine intelligence; Support vector machine classification; Support vector machines; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2005. IEEE-EMBS 2005. 27th Annual International Conference of the
Conference_Location :
Shanghai
Print_ISBN :
0-7803-8741-4
Type :
conf
DOI :
10.1109/IEMBS.2005.1615555
Filename :
1615555
Link To Document :
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