Title :
A simple and robust self-reset CMOS image sensor
Author :
Park, Dongwon ; Joo, Youngjoong ; Koppa, Santosh
Author_Institution :
LG Display, Paju, South Korea
Abstract :
A simple and robust self-reset pixel-level CMOS image sensor (CIS) has been designed and tested to verify the improvement of the signal-to-noise ratio (SNR) compare to the conventional asynchronous self-reset pixel-level CISs. It significantly reduces noise accumulation from multiple self-resets by replacing a comparator and redundant regenerative modules with a simple Schmitt trigger circuit.
Keywords :
CMOS image sensors; trigger circuits; CMOS image sensor; Schmitt trigger circuit; signal-to-noise ratio; Automatic testing; CMOS image sensors; Circuit noise; Circuit testing; Computational Intelligence Society; Noise reduction; Noise robustness; Pixel; Signal design; Signal to noise ratio; CIS; CMOS image sensor; SNR; Schmitt trigger;
Conference_Titel :
Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-7771-5
DOI :
10.1109/MWSCAS.2010.5548918
