• DocumentCode
    1577008
  • Title

    Tikhonov-Miller regularization with a denoisy and deconvolved signal as model of solution for improvement of depth resolution in SIMS analysis

  • Author

    Boulakroune, M´hamed ; Benatia, Djamel ; Slougui, Nabila ; Oualkadi, Ahmed El

  • Author_Institution
    Electr. Eng. Dept., Univ. Catholique de Louvain, Louvain-la-Neuve
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper the improvement by deconvolution of the depth resolution in Secondary Ion Masse Spectrometry (SIMS) analysis is studied. Indeed, a new Tikhonov-Miller deconvolution method, where a priori model of solution is included. The latter is a denoisy and pre-deconvolved signal obtained firstly by the application of wavelet shrinkage algorithm and after, by the introduction of the obtained denoisy signal in an iterative deconvolution algorithm. The results of the proposed algorithm are compared to those of Tikhonov-Miller regularization where the model of solution is a raw signal. Finally, based on the obtained results the advantages and limitations of the proposed method as well as suggestions for future work are presented and discussed.
  • Keywords
    deconvolution; iterative methods; secondary ion mass spectra; signal denoising; wavelet transforms; SIMS analysis; Tikhonov-Miller regularization; deconvolved signal; denoisy signal; depth resolution; iterative deconvolution algorithm; secondary ion masse spectrometry analysis; wavelet shrinkage algorithm; Data analysis; Deconvolution; Iterative algorithms; Laboratories; Mass spectroscopy; Noise reduction; Signal analysis; Signal resolution; Silicon; Telecommunications; SIMS; Tikhonov-Miller regularization; boron in silicon; depth resolution; wavelet shrinkage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information and Communication Technologies: From Theory to Applications, 2008. ICTTA 2008. 3rd International Conference on
  • Conference_Location
    Damascus
  • Print_ISBN
    978-1-4244-1751-3
  • Electronic_ISBN
    978-1-4244-1752-0
  • Type

    conf

  • DOI
    10.1109/ICTTA.2008.4530065
  • Filename
    4530065