DocumentCode
1577008
Title
Tikhonov-Miller regularization with a denoisy and deconvolved signal as model of solution for improvement of depth resolution in SIMS analysis
Author
Boulakroune, M´hamed ; Benatia, Djamel ; Slougui, Nabila ; Oualkadi, Ahmed El
Author_Institution
Electr. Eng. Dept., Univ. Catholique de Louvain, Louvain-la-Neuve
fYear
2008
Firstpage
1
Lastpage
6
Abstract
In this paper the improvement by deconvolution of the depth resolution in Secondary Ion Masse Spectrometry (SIMS) analysis is studied. Indeed, a new Tikhonov-Miller deconvolution method, where a priori model of solution is included. The latter is a denoisy and pre-deconvolved signal obtained firstly by the application of wavelet shrinkage algorithm and after, by the introduction of the obtained denoisy signal in an iterative deconvolution algorithm. The results of the proposed algorithm are compared to those of Tikhonov-Miller regularization where the model of solution is a raw signal. Finally, based on the obtained results the advantages and limitations of the proposed method as well as suggestions for future work are presented and discussed.
Keywords
deconvolution; iterative methods; secondary ion mass spectra; signal denoising; wavelet transforms; SIMS analysis; Tikhonov-Miller regularization; deconvolved signal; denoisy signal; depth resolution; iterative deconvolution algorithm; secondary ion masse spectrometry analysis; wavelet shrinkage algorithm; Data analysis; Deconvolution; Iterative algorithms; Laboratories; Mass spectroscopy; Noise reduction; Signal analysis; Signal resolution; Silicon; Telecommunications; SIMS; Tikhonov-Miller regularization; boron in silicon; depth resolution; wavelet shrinkage;
fLanguage
English
Publisher
ieee
Conference_Titel
Information and Communication Technologies: From Theory to Applications, 2008. ICTTA 2008. 3rd International Conference on
Conference_Location
Damascus
Print_ISBN
978-1-4244-1751-3
Electronic_ISBN
978-1-4244-1752-0
Type
conf
DOI
10.1109/ICTTA.2008.4530065
Filename
4530065
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