Title :
Test suite generation methods for concurrent systems based on coloured Petri nets
Author :
Watanabe, Harumi ; Kudoh, Tomohiro
Author_Institution :
Dept. of Comput. Sci., Tokyo Inst. of Technol., Yokohama, Japan
Abstract :
Automatic generation of test suites for concurrent systems is a newly exploited area of conformance tests. A few methods based on a finite state machine (FSM) have been proposed. However, these methods require a large amount of computation cost. By using coloured Petri nets (CPN), the required amount of computation costs can be reduced, and the length of the test suites can be reduced by using the equivalent marking technique on CPN. In addition, these methods allow us to test interaction parameters of concurrent systems. We propose two CPN based test suite generation methods for conformance tests: the coloured Petri net tree (CPT) method and the coloured Petri net graph (CPG) method. An experimental test suite generator (TSG) based on CPT method is presented. To show the advantages of the CPT and CPG methods, the effects of test suite length reduction by equivalent markings are evaluated
Keywords :
Petri nets; conformance testing; graph colouring; parallel programming; program testing; programming theory; trees (mathematics); coloured Petri net graph; coloured Petri net tree; coloured Petri nets; computation cost; concurrent systems; conformance tests; finite state machine; interaction parameters; marking technique; test suite generation methods; test suite generator; test suite length reduction; Automatic testing; Benchmark testing; Computer science; Costs; Information technology; Operating systems; Petri nets; Protocols; System testing; Tree graphs;
Conference_Titel :
Software Engineering Conference, 1995. Proceedings., 1995 Asia Pacific
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-8186-7171-8
DOI :
10.1109/APSEC.1995.496973