Title :
Crystallographic and magnetic properties in CoAl/sub 0.2/Fe/sub 1.8/O/sub 4/ thin films prepared by a sol-gel method
Author :
Sam Jin Kim ; Kwang-Ho Jeong ; Chul Sung Kim
Author_Institution :
Dept. of Phys., Kookmin Univ., Seoul, South Korea
Abstract :
Summary form only given. In this study the growth of Al substituted Co ferrite thin films on thermally oxidized silicon substrates is introduced by a sol-gel method as an alternative to some of the other deposition techniques that have been used to grow Co ferrite thin films. The structural and magnetic properties studies are presented by using an X-ray diffractometer (XRD), thermogravimetry analysis (TGA), differential thermal analysis (DTA), a vibrating sample magnetometer (VSM) and atomic force microscopy (AFM) as a function of the annealing temperature.
Keywords :
X-ray diffraction; aluminium compounds; atomic force microscopy; cobalt compounds; differential thermal analysis; ferrites; liquid phase deposited coatings; magnetic thin films; sol-gel processing; CoAl/sub 0.2/Fe/sub 1.8/O/sub 4/; CoAl/sub 0.2/Fe/sub 1.8/O/sub 4/ thin films; SiO/sub 2/; X-ray diffractometer; annealing temperature; atomic force microscopy; differential thermal analysis; magnetic properties; sol-gel method; structural properties; thermogravimetry analysis; vibrating sample magnetometer; Atomic force microscopy; Crystallography; Ferrite films; Magnetic analysis; Magnetic properties; Magnetometers; Silicon; Thermal force; X-ray diffraction; X-ray scattering;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1001484
