Crystallographic and magnetic properties in CoAl/sub 0.2/Fe/sub 1.8/O/sub 4/ thin films prepared by a sol-gel method

Author

Sam Jin Kim ; Kwang-Ho Jeong ; Chul Sung Kim

Author_Institution

Dept. of Phys., Kookmin Univ., Seoul, South Korea

fYear

2002

Abstract

Summary form only given. In this study the growth of Al substituted Co ferrite thin films on thermally oxidized silicon substrates is introduced by a sol-gel method as an alternative to some of the other deposition techniques that have been used to grow Co ferrite thin films. The structural and magnetic properties studies are presented by using an X-ray diffractometer (XRD), thermogravimetry analysis (TGA), differential thermal analysis (DTA), a vibrating sample magnetometer (VSM) and atomic force microscopy (AFM) as a function of the annealing temperature.

Keywords

X-ray diffraction; aluminium compounds; atomic force microscopy; cobalt compounds; differential thermal analysis; ferrites; liquid phase deposited coatings; magnetic thin films; sol-gel processing; CoAl/sub 0.2/Fe/sub 1.8/O/sub 4/; CoAl/sub 0.2/Fe/sub 1.8/O/sub 4/ thin films; SiO/sub 2/; X-ray diffractometer; annealing temperature; atomic force microscopy; differential thermal analysis; magnetic properties; sol-gel method; structural properties; thermogravimetry analysis; vibrating sample magnetometer; Atomic force microscopy; Crystallography; Ferrite films; Magnetic analysis; Magnetic properties; Magnetometers; Silicon; Thermal force; X-ray diffraction; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International

Conference_Location

Amsterdam, The Netherlands

Print_ISBN

0-7803-7365-0

Type

conf

DOI

10.1109/INTMAG.2002.1001484

Filename

1001484