Title :
Transient simulation of lossy multiconductor interconnects
Author :
Canavero, F. ; Maio, I.
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
Abstract :
The transient simulation of electrically-long low-loss multiconductor interconnects is considered from a practical point of view. The importance of frequency dependent losses in these interconnects is discussed and a simple transmission line characterization procedure allowing for such losses is proposed. The characterization obtained yields simple and efficient interconnect models, that the user can include, without programming, in any simulator accepting differential operators
Keywords :
circuit analysis computing; digital simulation; losses; network analysis; time-domain analysis; transient analysis; transmission line theory; electrically-long low-loss multiconductor interconnects; frequency dependent losses; transient simulation; transmission line characterization procedure; Losses;
Conference_Titel :
Electromagnetic Compatibility Proceedings, 1997 International Symposium on
Conference_Location :
Beijing
Print_ISBN :
0-7803-3608-9
DOI :
10.1109/ELMAGC.1997.617133