DocumentCode
1577346
Title
Development of low-cost high-resolution APD measuring equipment
Author
Uchino, Masaharu ; Hayashi, Yoshinobu ; Shinozuka, Takashi ; Sat, Risaburo
Author_Institution
Electromagnetic Compat. Res. Labs. Co. Ltd., Sendai, Japan
fYear
1997
Firstpage
253
Lastpage
256
Abstract
Given that amplitude probability distribution (APD) is an effective means of estimating the effects of electromagnetic disturbance on digital communications, we are now testing low-cost equipment for measuring APD at high resolution. The equipment combines multiple M-sequence counters having relatively prime periods and makes use of residue number systems (RNS) so that most of the circuits can be formed on one IC chip and a low-cost configuration can be achieved. In addition, the size of the discrete logarithm table, which is essential to restoring the enumerated value from the bit pattern output of the M-sequence counters, need be only 10-5 the size of a single M-sequence counter. By therefore arranging units of this APD measuring equipment into a parallel configuration, the processing speed can be increased by n times
Keywords
binary sequences; counting circuits; digital communication; electromagnetic compatibility; electromagnetic interference; probability; residue number systems; telecommunication equipment testing; EMC measurement; IC chip; RNS; amplitude probability distribution; bit pattern output; digital communications; discrete logarithm table; electromagnetic disturbance; high-resolution APD measuring equipment; low-cost measuring equipment; multiple M-sequence counters; parallel configuration; prime periods; processing speed; residue number systems; Electromagnetic compatibility;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility Proceedings, 1997 International Symposium on
Conference_Location
Beijing
Print_ISBN
0-7803-3608-9
Type
conf
DOI
10.1109/ELMAGC.1997.617135
Filename
617135
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