DocumentCode :
1577346
Title :
Development of low-cost high-resolution APD measuring equipment
Author :
Uchino, Masaharu ; Hayashi, Yoshinobu ; Shinozuka, Takashi ; Sat, Risaburo
Author_Institution :
Electromagnetic Compat. Res. Labs. Co. Ltd., Sendai, Japan
fYear :
1997
Firstpage :
253
Lastpage :
256
Abstract :
Given that amplitude probability distribution (APD) is an effective means of estimating the effects of electromagnetic disturbance on digital communications, we are now testing low-cost equipment for measuring APD at high resolution. The equipment combines multiple M-sequence counters having relatively prime periods and makes use of residue number systems (RNS) so that most of the circuits can be formed on one IC chip and a low-cost configuration can be achieved. In addition, the size of the discrete logarithm table, which is essential to restoring the enumerated value from the bit pattern output of the M-sequence counters, need be only 10-5 the size of a single M-sequence counter. By therefore arranging units of this APD measuring equipment into a parallel configuration, the processing speed can be increased by n times
Keywords :
binary sequences; counting circuits; digital communication; electromagnetic compatibility; electromagnetic interference; probability; residue number systems; telecommunication equipment testing; EMC measurement; IC chip; RNS; amplitude probability distribution; bit pattern output; digital communications; discrete logarithm table; electromagnetic disturbance; high-resolution APD measuring equipment; low-cost measuring equipment; multiple M-sequence counters; parallel configuration; prime periods; processing speed; residue number systems; Electromagnetic compatibility;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility Proceedings, 1997 International Symposium on
Conference_Location :
Beijing
Print_ISBN :
0-7803-3608-9
Type :
conf
DOI :
10.1109/ELMAGC.1997.617135
Filename :
617135
Link To Document :
بازگشت