Title :
Simulation of the field characteristics of TEM cell using the TLM method
Author :
Zhang Yunhua ; Jiang Jingshan
Author_Institution :
Center for Space Sci. & Appl. Res., Acad. Sinica, Beijing
Abstract :
The field distributions of a TEM cell with finite depth of the inner conductor are simulated by using the TLM method. Numerical results show that, both of the cut-off wavelength and field distributions vary with the size of the inner conductor. It also shows that the TLM method can be conveniently and effectively used to analyze and design the TEM cell for EMC measurement
Keywords :
digital simulation; electromagnetic compatibility; electromagnetic fields; simulation; test facilities; transmission line matrix methods; EMC measurement; TEM cell; TLM method; cut-off wavelength; field characteristics simulation; inner conductor depth; transmission line matrix; Electromagnetic compatibility;
Conference_Titel :
Electromagnetic Compatibility Proceedings, 1997 International Symposium on
Conference_Location :
Beijing
Print_ISBN :
0-7803-3608-9
DOI :
10.1109/ELMAGC.1997.617136
