DocumentCode :
1578050
Title :
Fault sensitivity analysis of a 32-bit RISC microprocessor
Author :
Lee, Kab Joo
Author_Institution :
ASIC Div., Samsung Electron. Co. Ltd., Kyungki, South Korea
fYear :
1999
fDate :
6/21/1905 12:00:00 AM
Firstpage :
529
Lastpage :
532
Abstract :
This paper describes fault sensitivity analysis of a 32-bit RISC microprocessor. Logic-level transient faults are injected into the processor design that models an instruction subset of the MIPS R2000/3000 microprocessor. The processor model consists of gate-level Verilog HDL descriptions of pipeline datapath and behavioral models including memory system and register file. Faults are injected into the gate-level part of the design, and simulation is performed with the workload of four integer application programs. During simulation, fault manifestation and error propagation are monitored for key functional units of the pipeline datapath. For fault sensitivity analysis, the monitored data are categorized into pre-defined error classes. The experimental results show that the program counter is highly sensitive to transient faults, i.e., over 60% of injected faults resulted in fatal errors which caused the abnormal program terminations. This result suggests that incorporating fault-tolerant mechanisms into the program counter unit is highly desirable for mission-critical applications
Keywords :
computer testing; fault simulation; microprocessor chips; pipeline processing; reduced instruction set computing; sensitivity analysis; virtual machines; 32 bit; MIPS R2000/3000 microprocessor; RISC microprocessor; behavioral models; error propagation monitoring; fault monitoring; fault sensitivity analysis; fault-tolerant mechanisms; gate-level Verilog HDL descriptions; logic-level transient fault injection; memory system; mission-critical applications; pipeline datapath models; pre-defined error classes; processor model; program counter; register file; simulation; transient faults; Counting circuits; Fault tolerance; Hardware design languages; Microprocessors; Monitoring; Pipelines; Process design; Reduced instruction set computing; Registers; Sensitivity analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI and CAD, 1999. ICVC '99. 6th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-5727-2
Type :
conf
DOI :
10.1109/ICVC.1999.820992
Filename :
820992
Link To Document :
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