• DocumentCode
    1578171
  • Title

    Lock-Ins in Network Effect Markets -- Results of a Simulation Study

  • Author

    Draisbach, T. ; Widjaja, T. ; Buxmann, Peter

  • Author_Institution
    Tech. Univ. Darmstadt, Darmstadt, Germany
  • fYear
    2013
  • Firstpage
    1464
  • Lastpage
    1473
  • Abstract
    Adoption processes in network effect markets -- like the ICT industry -- often lead to so-called "lock-ins" which means that one single standard or technology gets adopted by almost all market participants. Based on the work of Arthur [1] we present a simulation based model explaining a market\´s tendency to lock-in by means of two factors: the strength of network effects and the network topology of potential adopters. In order to obtain a better understanding of the interconnection of the actors\´ decisions we developed an approach to compare markets that show the same network effect strength but face different actor network topologies. We found that the predisposition of a market to show a lock-in induced by network effects generally increases with growing network effect strength and network density. However, our analysis shows that the way these two factors affect a market\´s tendency to lock-in varies between random topologies and real life social topologies.
  • Keywords
    DP industry; information systems; socio-economic effects; topology; ICT industry; actor network topologies; adoption processes; information systems; lock-ins; network density; network effect markets; network effect strength; potential adopter network topology; random topologies; real life social topologies; simulation based model; software industry; Analytical models; Industries; Information systems; Network topology; Social network services; Software; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Sciences (HICSS), 2013 46th Hawaii International Conference on
  • Conference_Location
    Wailea, Maui, HI
  • ISSN
    1530-1605
  • Print_ISBN
    978-1-4673-5933-7
  • Electronic_ISBN
    1530-1605
  • Type

    conf

  • DOI
    10.1109/HICSS.2013.386
  • Filename
    6480014