Title :
The measurement study of radiated emission for chip microcomputer development system
Author :
Changlin, Zhou ; Xuebing, Qin ; Zhongyi, Zbu ; Qingmei, Chang
Author_Institution :
Zheng Zhou Inst. of Electron. Technol., China
Abstract :
This paper presents the principle and method of chip microcomputer radiated emission using a TEM cell. It gives the calculation formulas of equivalent radiated power in free space. It also gives the emission measurement result for the MCS-51 chip microcomputer development system in the frequency band 0.15 MHz-30 MHz and gives further explanations
Keywords :
computer testing; electromagnetic compatibility; microcomputers; radiofrequency interference; 0.15 to 30 MHz; MCS-51 chip microcomputer development system; TEM cell; equivalent radiated power; free space; measurement study; radiated emission; Microcomputers;
Conference_Titel :
Electromagnetic Compatibility Proceedings, 1997 International Symposium on
Conference_Location :
Beijing
Print_ISBN :
0-7803-3608-9
DOI :
10.1109/ELMAGC.1997.617169
