Title :
Reliability-Aware Design Optimization for Multiprocessor Embedded Systems
Author :
Huang, Jia ; Blech, Jan Olaf ; Raabe, Andreas ; Buckl, Christian ; Knoll, Alois
Author_Institution :
fortiss GmbH, Munich, Germany
Abstract :
This paper presents an approach for the reliability-aware design optimization of real-time systems on multi-processor platforms. The optimization is based on an extension of well accepted fault- and process-models. We combine utilization of hardware replication and software re-execution techniques to tolerate transient faults. A System Fault Tree (SFT) analysis is proposed, which computes the system-level reliability in presence of the hardware and software redundancy based on component failure probabilities. We integrate the SFT analysis with a Multi-Objective Evolutionary Algorithm (MOEA) based optimization process to perform efficient reliability-aware design space exploration. The solution resulting from our optimization contains the mapping of tasks to processing elements (PEs), the exact task and message schedule and the fault-tolerance policy assignment. The effectiveness of the approach is illustrated using several case studies.
Keywords :
embedded systems; evolutionary computation; fault tolerant computing; fault trees; multiprocessing systems; optimisation; MOEA based optimization; component failure probabilities; fault-tolerance policy assignment; hardware replication; multiobjective evolutionary algorithm; multiprocessor embedded systems; multiprocessor platforms; processing elements; real-time systems; reliability-aware design optimization; reliability-aware design space exploration; software redundancy; software reexecution techniques; system fault tree analysis; system-level reliability; transient faults; Hardware; Optimization; Redundancy; Schedules; Software; Design optimization; Embedded software; Fault tolerant systems; Integrated circuit reliability;
Conference_Titel :
Digital System Design (DSD), 2011 14th Euromicro Conference on
Conference_Location :
Oulu
Print_ISBN :
978-1-4577-1048-3
DOI :
10.1109/DSD.2011.34