Title :
A BISR (built-in self-repair) circuit for embedded memory with multiple redundancies
Author :
Kim, Heon-cheol ; Yi, Dong-soon ; Park, Jin-young ; Cho, Chang-hyun
Author_Institution :
Samsung Electron., Kyunggi, South Korea
fDate :
6/21/1905 12:00:00 AM
Abstract :
This paper presents an efficient repair algorithm for embedded memory with multiple redundancies and a BISR (built-in self-repair) circuit using the proposed algorithm. While there are many repair algorithms which have good repair capability, their complexity is too high to implement. We present a repair algorithm which has good repair capability with little hardware overhead
Keywords :
built-in self test; embedded systems; redundancy; semiconductor storage; BISR; built-in self-repair; embedded memory; hardware overhead; multiple redundancies; repair algorithms; repair capability; Algorithm design and analysis; Built-in self-test; Central Processing Unit; Circuit testing; Engines; Failure analysis; Hardware; Large scale integration; Redundancy; System-on-a-chip;
Conference_Titel :
VLSI and CAD, 1999. ICVC '99. 6th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-5727-2
DOI :
10.1109/ICVC.1999.821012
