DocumentCode
1578810
Title
Dual tone analysis for phase-plane coverage in ADC metrological characterization
Author
Monteiro, Conceição Líbano ; Arpaia, Pasquale ; Serra, António Cruz
Author_Institution
Telecommun. Inst., Tech. Univ. of Lisbon, Lisboa, Portugal
Volume
2
fYear
2003
Firstpage
1334
Abstract
An analytical description of the phase plane behavior of an amplitude-balanced dual-tone signal for nonlinear analog-to-digital converters testing is presented. A new figure of merit for the phase plane coverage quality of the dual-tone test signal is proposed and evaluated, and finally, conditions for optimal input frequency selection are analytically derived for practical calibration applications.
Keywords
analogue-digital conversion; calibration; integrated circuit testing; ADC metrological characterization; amplitude-balanced dual-tone signal; analog-to-digital converter; dual tone analysis; figure of merit; input frequency selection; nonlinear ADC testing; phase plane coverage; Calibration; Frequency; Niobium; Sampling methods; Signal analysis; Signal mapping; Signal processing; Testing; Uniform resource locators; World Wide Web;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
ISSN
1091-5281
Print_ISBN
0-7803-7705-2
Type
conf
DOI
10.1109/IMTC.2003.1207968
Filename
1207968
Link To Document