INL and DNL estimation based on noise ADC test

Author

Da Gloria Flores, Maria ; Negreiros, Marcelo ; Carro, Luigi ; Susin, Altamiro

Author_Institution

Departamento de Engenharia Eletrica, Univ. Fed. do Rio Grande do Sul, Brazil

Volume

2

fYear

2003

Firstpage

1350

Abstract

This paper presented the linearity characterization of an analog-to-digital converter. The input signal is noise, which allows low analog area overhead for Built In Self Test (BIST). The linearity errors estimation is proposed based on the spectral analysis of only the output of the converter. This paper presents the underlying theory and practical results supporting the effectiveness of the proposed method.

Keywords

analogue-digital conversion; built-in self test; integrated circuit noise; integrated circuit testing; linearisation techniques; nonlinear estimation; spectral analysis; BIST; DNL estimation; INL estimation; analog area overhead; analog-to-digital converter; built in self test; converter output; differential nonlinearity; integral nonlinearity; linearity characterization; linearity error estimation; noise ADC test; spectral analysis; Analog-digital conversion; Automatic testing; Circuit testing; Costs; Error correction; Linearity; Signal analysis; Signal processing; Spectral analysis; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE

ISSN

1091-5281

Print_ISBN

0-7803-7705-2

Type

conf

DOI

10.1109/IMTC.2003.1207971

Filename

1207971