Title :
Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC
Author :
Pouget, V. ; Lewis, D. ; Fouillat, P.
Author_Institution :
Univ. Bordeaux, Talence, France
Abstract :
This paper presents an experimental system for integrated circuits testing with a pulsed laser beam. The system is fully automated and simultaneously provides interesting spatial and temporal resolutions for various applications like fault injection, radiation sensitivity evaluation, or default localization. In the presented application, the system is used to visualize signal propagation in an 8 bit half-flash ADC.
Keywords :
analogue-digital conversion; integrated circuit testing; laser beam effects; 8 bit; ADC; analog-to-digital converter; default localization; integrated circuits testing; pulsed laser beam; radiation sensitivity evaluation; signal propagation; spatial resolution; temporal resolution; time-resolved scanning; transient fault injection; Application specific integrated circuits; Circuit faults; Integrated circuit testing; Laser applications; Laser beams; Optical pulses; Pulse circuits; Signal resolution; Spatial resolution; Visualization;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1207976
