• DocumentCode
    1579532
  • Title

    BackSpace: Formal Analysis for Post-Silicon Debug

  • Author

    De Paula, Flavio M. ; Gort, Marcel ; Hu, Alan J. ; Wilton, Steven J E ; Yang, Jin

  • Author_Institution
    Dept. of Comput. Sci., Univ. of British Columbia, Vancouver, BC
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Post-silicon debug is the problem of determining what\´s wrong when the fabricated chip of a new design behaves incorrectly. This problem now consumes over half of the overall verification effort on large designs, and the problem is growing worse. We introduce a new paradigm for using formal analysis, augmented with some on-chip hardware support, to automatically compute error traces that lead to an observed buggy state, thereby greatly simplifying the post-silicon debug problem. Our preliminary simulation experiments demonstrate the potential of our approach: we can "backspace" hundreds of cycles from randomly selected states of some sample designs. Our preliminary architectural studies propose some possible implementations and show that the on-chip overhead can be reasonable. We conclude by surveying future research directions.
  • Keywords
    formal verification; integrated circuit design; integrated circuit testing; BackSpace; design error; formal analysis; on-chip hardware support; postsilicon debug; Circuit testing; Computer crashes; Debugging; Design engineering; Formal verification; Job shop scheduling; Monitoring; Observability; Silicon; Vehicle crash testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Formal Methods in Computer-Aided Design, 2008. FMCAD '08
  • Conference_Location
    Portland, OR
  • Print_ISBN
    978-1-4244-2735-2
  • Electronic_ISBN
    978-1-4244-2736-9
  • Type

    conf

  • DOI
    10.1109/FMCAD.2008.ECP.9
  • Filename
    4689168