Title :
How a Symmetry Metric Assists Side-Channel Evaluation - A Novel Model Verification Method for Power Analysis
Author :
Heuser, Annelie ; Kasper, Michael ; Schindler, Werner ; Stöttinger, Marc
Author_Institution :
Integrated Circuits & Syst. Lab., Tech. Univ. Darmstadt, Darmstadt, Germany
Abstract :
Side-channel analysis has become an important field of research for the semiconductor industry and for the academic sector as well. Of particular interest is constructive side-channel analysis as it supports a target-oriented associated design process. The main goal is to increase the side-channel resistance of cryptographic implementations within the design phase by a combination of advanced stochastic methods with design methods, tools, and countermeasures. In this contribution we present a new enhanced tool that utilizes symmetry properties to assist the side-channel evaluation of cryptographic implementations. This technique applies a symmetry metric, which is introduced as an engineering tool to verify the suitability of the leakage model in the evaluation phase of security-sensitive designs. Additionally, this approach also supports the designer in the selection of appropriate time instants.
Keywords :
cryptography; stochastic processes; constructive side-channel analysis; cryptography; model verification method; power analysis; security-sensitive designs; side-channel evaluation; stochastic methods; symmetry metric; target-oriented associated design process; Cryptography; Equations; Mathematical model; Power measurement; Random variables; Stochastic processes; Model verification; Secure Design; Side-channel analysis; stochastic approach;
Conference_Titel :
Digital System Design (DSD), 2011 14th Euromicro Conference on
Conference_Location :
Oulu
Print_ISBN :
978-1-4577-1048-3
DOI :
10.1109/DSD.2011.91