Title :
Application of decision trees for integrated circuit yield improvement
Author :
Raghavan, Venkat
Author_Institution :
Agere Syst., Singapore
fDate :
6/24/1905 12:00:00 AM
Abstract :
In order to meet high expectations on yield targets, quick identification of root cause for yield loss is essential. Decision trees are shown to be a powerful data mining tool for integrated circuit yield improvement. Several case studies from yield improvement efforts on real products have been presented.
Keywords :
circuit analysis computing; data mining; decision trees; integrated circuit yield; production engineering computing; data mining tool; decision trees; integrated circuit yield improvement; intelligent data analysis; yield targets; yield variability; Application specific integrated circuits; Classification tree analysis; Data analysis; Data mining; Decision trees; Failure analysis; Integrated circuit yield; Regression tree analysis; Semiconductor device manufacture; Testing;
Conference_Titel :
Advanced Semiconductor Manufacturing 2002 IEEE/SEMI Conference and Workshop
Print_ISBN :
0-7803-7158-5
DOI :
10.1109/ASMC.2002.1001615
