• DocumentCode
    1580032
  • Title

    UML model for the IEEE 1451.1 standard

  • Author

    Lee, Kang ; Song, Eugene Y.

  • Author_Institution
    National Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    2
  • fYear
    2003
  • Firstpage
    1587
  • Abstract
    The IEEE 1451.1 Standard for Smart Transducer Interface for Sensors and Actuators - Network Capable Application Processor (NCAP) Information Model was established to define a common object model and interface specification for the components of a networked smart transducer. The Unified Modeling Language (UML) is a powerful tool for object-oriented modeling and design of complex systems. There is no existing UML model for the IEEE 1451.1 standard. This paper describes the development of an UML model for the IEEE 1451.1 specification. The resulting UML model captures the attributes, operations, and behavior information of the IEEE 1451.1 objects. This model includes the data model and the object model of IEEE 1451.1 standard. It will provide a way to shorten the development time for IEEE 1451.1-based smart sensor applications and to ease the integration of IEEE 1451.1 to other standard such as MIMOSA and OSA-CBM, which are used for condition-based maintenance of equipment.
  • Keywords
    IEEE standards; formal specification; intelligent actuators; intelligent sensors; object-oriented languages; specification languages; IEEE 1451.1 standard; NCAP information model; UML model; actuators; data model; interface specification; network capable application processor; networked smart transducer; object model; object-oriented modeling; sensors; smart sensor applications; smart transducer interface; unified modeling language; Electronic mail; Instruments; Intelligent sensors; NIST; Object oriented modeling; Power system modeling; Standards development; Transducers; USA Councils; Unified modeling language;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
  • Conference_Location
    Vail, Colorado, USA
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-7705-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2003.1208017
  • Filename
    1208017