Aerospace optoelectronics reliability: application of multi-parametric BAZ model

The attributes and challenges of the PDfR concept and the role of its major constituents - failure oriented accelerated testing (FOAT) and physically meaningful predictive modeling (PM) - are addressed, advanced and discussed in detail, with an emphasis on the application of the recently suggested powerful and flexible Boltzmann-Arrhenius-Zhurkov (BAZ) model, and particularly on its multi-parametric version. The BAZ model can be effectively used to analyze and design an opto-electronic (OE) device or a system with the predicted, quantified, assured, and, if appropriate and cost-effective, even maintained probability of failure (PoF) in the field. This could be done, e.g., by employing prognostics-and-health monitoring (PHM) methods and techniques.