DocumentCode :
1580509
Title :
Supercritical fluid processes for semiconductor device fabrication
Author :
Rothman, Laura B. ; Robey, Raymond J. ; Ali, Mir K. ; Mount, David J.
Author_Institution :
SC Fluids Inc., Nashua, NH, USA
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
372
Lastpage :
375
Abstract :
As semiconductor device dimensions approach the nanoscale, it will become increasing difficult to use aqueous-based cleaning processes due to high surface tension and capillary forces. Supercritical fluids provide the enabling capabilities for overcoming these process barriers. This paper will discuss the use of supercritical carbon dioxide and co-solvents for photoresist stripping and wafer cleaning.
Keywords :
semiconductor technology; surface cleaning; CO2; co-solvent; photoresist stripping; semiconductor device fabrication; supercritical carbon dioxide; supercritical fluid processing; wafer cleaning; Carbon dioxide; Cleaning; Fabrication; Gases; Nanoscale devices; Resists; Semiconductor devices; Solvents; Surface tension; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing 2002 IEEE/SEMI Conference and Workshop
Print_ISBN :
0-7803-7158-5
Type :
conf
DOI :
10.1109/ASMC.2002.1001636
Filename :
1001636
Link To Document :
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