Title :
Supercritical fluid processes for semiconductor device fabrication
Author :
Rothman, Laura B. ; Robey, Raymond J. ; Ali, Mir K. ; Mount, David J.
Author_Institution :
SC Fluids Inc., Nashua, NH, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
As semiconductor device dimensions approach the nanoscale, it will become increasing difficult to use aqueous-based cleaning processes due to high surface tension and capillary forces. Supercritical fluids provide the enabling capabilities for overcoming these process barriers. This paper will discuss the use of supercritical carbon dioxide and co-solvents for photoresist stripping and wafer cleaning.
Keywords :
semiconductor technology; surface cleaning; CO2; co-solvent; photoresist stripping; semiconductor device fabrication; supercritical carbon dioxide; supercritical fluid processing; wafer cleaning; Carbon dioxide; Cleaning; Fabrication; Gases; Nanoscale devices; Resists; Semiconductor devices; Solvents; Surface tension; Temperature;
Conference_Titel :
Advanced Semiconductor Manufacturing 2002 IEEE/SEMI Conference and Workshop
Print_ISBN :
0-7803-7158-5
DOI :
10.1109/ASMC.2002.1001636