Title :
On the Accuracy of Spectrum-based Fault Localization
Author :
Abreu, Rui ; Zoeteweij, Peter ; Van Gemund, Arjan J C
Author_Institution :
Delft Univ. of Technol., Delft
Abstract :
Spectrum-based fault localization shortens the test- diagnose-repair cycle by reducing the debugging effort. As a light-weight automated diagnosis technique it can easily be integrated with existing testing schemes. However, as no model of the system is taken into account, its diagnostic accuracy is inherently limited. Using the Siemens Set benchmark, we investigate this diagnostic accuracy as a function of several parameters (such as quality and quantity of the program spectra collected during the execution of the system), some of which directly relate to test design. Our results indicate that the superior performance of a particular similarity coefficient, used to analyze the program spectra, is largely independent of test design. Furthermore, near- optimal diagnostic accuracy (exonerating about 80% of the blocks of code on average) is already obtained for low-quality error observations and limited numbers of test cases. The influence of the number of test cases is of primary importance for continuous (embedded) processing applications, where only limited observation horizons can be maintained.
Keywords :
program debugging; program diagnostics; program testing; light-weight automated diagnosis technique; low-quality error observations; spectrum-based fault localization; test data analysis; test-diagnose-repair cycle; Automatic testing; Benchmark testing; Computer industry; Debugging; Failure analysis; Fault detection; Fault diagnosis; Fault location; Mathematics; Software testing;
Conference_Titel :
Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION, 2007. TAICPART-MUTATION 2007
Conference_Location :
Windsor
Print_ISBN :
978-0-7695-2984-4
DOI :
10.1109/TAIC.PART.2007.13