DocumentCode
1581941
Title
On the Accuracy of Spectrum-based Fault Localization
Author
Abreu, Rui ; Zoeteweij, Peter ; Van Gemund, Arjan J C
Author_Institution
Delft Univ. of Technol., Delft
fYear
2007
Firstpage
89
Lastpage
98
Abstract
Spectrum-based fault localization shortens the test- diagnose-repair cycle by reducing the debugging effort. As a light-weight automated diagnosis technique it can easily be integrated with existing testing schemes. However, as no model of the system is taken into account, its diagnostic accuracy is inherently limited. Using the Siemens Set benchmark, we investigate this diagnostic accuracy as a function of several parameters (such as quality and quantity of the program spectra collected during the execution of the system), some of which directly relate to test design. Our results indicate that the superior performance of a particular similarity coefficient, used to analyze the program spectra, is largely independent of test design. Furthermore, near- optimal diagnostic accuracy (exonerating about 80% of the blocks of code on average) is already obtained for low-quality error observations and limited numbers of test cases. The influence of the number of test cases is of primary importance for continuous (embedded) processing applications, where only limited observation horizons can be maintained.
Keywords
program debugging; program diagnostics; program testing; light-weight automated diagnosis technique; low-quality error observations; spectrum-based fault localization; test data analysis; test-diagnose-repair cycle; Automatic testing; Benchmark testing; Computer industry; Debugging; Failure analysis; Fault detection; Fault diagnosis; Fault location; Mathematics; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION, 2007. TAICPART-MUTATION 2007
Conference_Location
Windsor
Print_ISBN
978-0-7695-2984-4
Type
conf
DOI
10.1109/TAIC.PART.2007.13
Filename
4344104
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