DocumentCode :
1582069
Title :
High voltage, high current, high di/dt solid state switch
Author :
Glidden, S.C.
Author_Institution :
Appl. Pulsed Power, Inc., Ithaca, NY, USA
Volume :
2
fYear :
2001
Firstpage :
1043
Abstract :
A high voltage, high di/dt, modular solid state switch intended to replace thyratrons in high power modular applications is under development. This paper describes the results of testing a switch module with a 10 kV, 6 kA, 30 kA/microsecond, 3 /spl mu/s PFN, under normal and load fault conditions. Included are data on switching losses and thermal performance during repetition rate operation. Experiments using alternate PFN´s to obtain higher di/dt operation are discussed. Initial results of multiple module tests with a 30 kV PFN are presented. The switch module uses three 5 kV, 15 mm diameter, thyristors connected in series. These thyristors were developed specifically for pulsed power applications, and have an interdigitated gate/cathode geometry to minimize turn-on losses and maximize di/dt. The module´s trigger circuit uses the switched energy to drive the thyristor gates, eliminating the need for an external gate drive power supply. A 35 V, 1 A, 50 ns risetime pulse triggers the module. The total switch inductance is <50 nH, if the case is used as the return current path. The compact, economical, modular package design facilitates the development of drop-in replacement switches for thyratrons with voltage ratings of >60 kV.
Keywords :
electrical faults; high-voltage engineering; losses; modules; power semiconductor switches; pulsed power switches; thyristor applications; 1 A; 10 kV; 15 mm; 30 kV; 35 V; 5 kV; 50 ns; 6 kA; drop-in replacement switches; high di/dt solid state switch; high power modular applications; high voltage solid state switch; interdigitated gate/cathode geometry; load fault conditions; modular package design; modular solid state switch; multiple module tests; normal conditions; pulsed power applications; repetition rate operation; switching losses; thermal performance; thyristors; turn-on losses minimisation; Circuit faults; Performance loss; Pulsed power supplies; Solid state circuits; Switches; Switching loss; Testing; Thyratrons; Thyristors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Plasma Science, 2001. PPPS-2001. Digest of Technical Papers
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7120-8
Type :
conf
DOI :
10.1109/PPPS.2001.1001722
Filename :
1001722
Link To Document :
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