• DocumentCode
    1582545
  • Title

    Methods for the automated selection of test frequencies for fault diagnosis in analog electronic circuits: a comparison

  • Author

    Alippi, C. ; Catelani, M. ; Fort, A. ; Mugnaini, M.

  • Author_Institution
    Politecnico di Milano
  • Volume
    1
  • fYear
    2003
  • Firstpage
    60
  • Lastpage
    64
  • Keywords
    Analytical models; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Electronic circuits; Electronic equipment testing; Fault diagnosis; Frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-7705-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2003.1208122
  • Filename
    1208122
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1582545