DocumentCode :
1582908
Title :
17 GHz transceiver design in 0.13 μm CMOS
Author :
Tiebout, M. ; Kienmayer, C. ; Thüringer, R. ; Sandner, C. ; Wohlmuth, H.D. ; Berry, M. ; Scholtz, A.L.
Author_Institution :
Corporate Res., INFINEON Technol. AG, Munich, Germany
fYear :
2005
Firstpage :
101
Lastpage :
104
Abstract :
The paper presents the research work towards a fully integrated 17 GHz transceiver in 0.13 μm standard CMOS. The simultaneous challenge of high-integration, highest frequency and low-voltage design is solved combining optimized on-chip passives and RF circuit techniques with a double-conversion sliding RF-architecture. Three measured chips clearly demonstrate the feasibility of a CMOS transceiver at highest frequency. A fully integrated Δ-Σ 13 GHz PLL consumes 60 mW from 1.5 V supply. The complete RF RX-path features a gain of 37 dB, IIP3 of -37 dBm and an SSB NF of 9.3 dB, consuming 180.8 mW from 1.5 V supply. A first TX path test-chip includes the second modulator and linear output driver. Consuming 93 mW from 1.5 V supply, it features a gain of 4 dB and an OIP3 of 13 dBm.
Keywords :
CMOS integrated circuits; MMIC amplifiers; integrated circuit design; phase locked loops; transceivers; Δ-Σ PLL; 0.13 micron; 1.5 V; 13 GHz; 17 GHz; 180.8 mW; 37 dB; 4 dB; 60 mW; 9.3 dB; 93 mW; CMOS; LNA; RF circuit techniques; RF receiver path; delta-sigma locked loop; double-conversion sliding RF-architecture; high frequency; high-integration; integrated transceiver design; linear output driver; low-voltage; noise figure; optimized on-chip passives; second modulator; third order input intercept point; third order output intercept point; transmitter path test-chip; Amplitude modulation; Design optimization; Frequency measurement; Gain; Integrated circuit measurements; Noise measurement; Phase locked loops; Radio frequency; Semiconductor device measurement; Transceivers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency integrated Circuits (RFIC) Symposium, 2005. Digest of Papers. 2005 IEEE
ISSN :
1529-2517
Print_ISBN :
0-7803-8983-2
Type :
conf
DOI :
10.1109/RFIC.2005.1489599
Filename :
1489599
Link To Document :
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